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CSX-300 |
CSX-400 |
Winner of the Photonics Circle of Excellence Award |
CSX-500 |
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Crystal-Scan is an interactive modular system for laser beam and optics characterization easily reconfigurable for high-precision and fast measurements of several parameters of laser beams, focusing optics and other optical components that are substantial for most laser applications.
The base models allow:
- high precision determination of focus position
- measuring diameter of focused laser beams
- measuring peak power density of the beam
- characterization of quality of lenses and objectives
Crystal-Scan is the only commercially available device with the range of focal waist measurements from less than 1 mm and up to 100 mm diameter. It can be set up within minutes, and performs the measurement within seconds.
Optional accessories extend the capabilities of the system to measuring:
- laser beam divergence
- quality factor
- diameter of unfocused laser beams (mircoscanning configuration), and
- power of unfocused laser beams (mircoscanning configuration).
Measurements of power and beam diameter in Microscanning configuration, are performed on-line, without introducing any appreciable distortion into the beam.
The educational model CSX-300 (educational model) allows simplified insertion and removal of lenses without affecting the alignment of the overall system. In a single laboratory hour, students will be able to verify all main laws governing laser beam propagation, and the effect of aberrations.
A reliable and an affordable measuring tool for everyday needs of optics professionals and laser users…
| Device feature/Model |
CSX-400 |
CSX-500 |
CSX-300 |
| Waist measurement range |
2 μm - 200 μm |
0.5 μm - 100 μm |
3 μm - 150 μm |
| Unfocused beam width measurements range |
100 μm - 5 mm |
100 μm - 3 mm |
100 μm - 5 mm |
| Laser power range |
1 mW – 10 W |
1 mW – 10 W |
1 mW – 10 W |
| Damage threshold |
1 kW/cm2 - 1 MW/cm2 |
1 kW/cm2 - 1 MW/cm2 |
1 kW/cm2 - 1 MW/cm2 |
| Power density range |
10 W/cm2 – 1 MW/cm2 |
10 W/cm2 – 1 MW/cm2 |
10 W/cm2 – 1 MW/cm2 |
| Wavelength range |
0.4 mm - 1.8 mm |
0.4 mm - 1.8 μm |
0.4 mm - 1.8 mm |
| Aperture of sensor head |
12.5 mm or 25.4 mm |
0.4” x 0.4" |
12.5 mm or 25.4 mm |
| Measurement time |
30 s |
20 s |
30 s |
| Absolute standard error |
< 4 % |
< 4 % |
< 4 % |
| Weight |
546 g |
412 g |
574 g |
| Dimensions |
3.25” x 8” x 1.5” |
1.5” x 2” x 6” |
3.25” x 9.5” x 1.5” |
| Power supply |
110 V/220 V |
110 V/220 V |
110 V/220 V |
| Data acquisition and display |
Desktop or Notebook |
Desktop or Notebook |
Desktop or Notebook |
| Lead Time |
6 weeks |
6 weeks |
3 weeks |
| Noninear Optical Element |
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LC-VL1 |
LC-VL2 |
LC-IL |
| Wavelength range |
0.4 μm – 0.7 μm |
0.4 μm – 1.8 μm |
0.9 μm – 1.3 μm |
| Power range |
1 mW - 100 mW |
100 mW - 10 W |
1 mW - 100 mW |
| Maximum power density |
1 kW/cm2 |
1 MW/cm2 |
1 kW/cm2 |
| Clear aperture sizes available |
12.5 mm, 25.4 mm, 10 mm x 10 mm |
| Photodetector* |
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PDA-55 |
PDA-155 |
PDA-400 |
| Wavelength range |
0.4 mm – 1.1 mm |
0.2 mm – 1.1 mm |
0.7 mm – 1.8 mm |
| * Thorlab parts |
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Pricelist
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Device Model (Includes scanning unit, software, control unit (D-Box))
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| CSX-400 |
$3,950.00 |
| CSX-500 |
$2,950.00 |
| CSX-300 |
$1,950.00 |
| Photodetector |
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| PDA155(ThorLabs) 0.2-1.1 μm |
$322.00 |
| PDA55(ThorLabs) 0.4-1.1 μm |
$289.00 |
| PDA400(ThorLabs) 0.7-1.8 μm |
$389.00 |
| Sensor head |
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| 0.4 - 0.7 μm, 1-10 mW |
$300.00 |
| 0.4-1.8 μm, 100 mW - 10 W |
$300.00 |
| 0.4-1.8 μm, 5 - 100 W |
$300.00 |
| Data acquisition |
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| PCI-6023 |
$395.00 |
| PCI-6024 |
$575.00 |
| DAQCard-6024E(PCMCIA) |
$695.00 |
| Microscanning attachement |
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| MS-T1(optional) |
$100.00 |
| Divergence measuring attachement |
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| D-1(optional) |
$350.00 |
Z-scan measurements of the on-axis intensity on the scan coordinate for the optical nonlinearity
References
- N.V. Tabiryan, “Liquid crystals measure light intensity”, Laser Focus World, April, 34, pp. 165-168 (1998).
- S.R. Nersisyan, N.V. Tabiryan, L.B. Glebov, L.N. Glebova, Nonlinear lens mapping of optical substrates, Proc. SPIE 6101, 370-376 (2006).
- S.R. Nersisyan, N.V. Tabiryan, C. Martin Stickley, Application of nonlinear optical techniques to characterization of glass and high power near IR cw laser beams, Proc. SPIE 5991, 599124-1 – 599124-11 (2005).
- N.V. Tabiryan, V. Jonnalagadda, M. Mora, S. R. Nersisyan, Laser beam and optics characterization with “z-scan” method, Proc. SPIE 4932, 7th International Workshop on Laser Beam and Optics Characterization, Boulder CO., pp. 656-666 (2003).
- N.V. Tabirian, H.L. Margaryan, “Nonlinear optical techniques for visualization and measurement of laser beams: M2 – measurements”, Edited by H. Laabs and H. Weber, 5th International Workshop on Laser Beam and Optics Characterization (LBOC), pp. 107-115 (2000).
- M. Bolshtyansky, N.V. Tabiryan, B.Ya. Zel’dovich. BRIEFING: beam reconstruction by iteration of an electromagnetic field with an induced nonlinearity gauge, Optics Letters 22, 22-24 (1997).
- N.V. Tabiryan, P. LiKamWa, B.Ya. Zel’dovich, T. Tschudi, T. Vogeler, Characterization of high power laser beams with the aid of nonlinear optical processes, SPIE 2870, 12-21 (1996).
- N.V. Tabiryan, T. Vogeler, T. Tschudi, B.Ya. Zel'dovich. All-optical, in-line, unperturbing and parallel measurement of laser beam intensity with transparent thin layers of liquid crystals”. Journal of Nonlinear Optical Physics, 4, 843-856 (1995).
- N.V. Tabiryan, T. Vogeler, T. Tschudi, B.Ya. Zel'dovich, Laser beam measurement with liquid crystals, Proc. SPIE 2375, 281-287 (1995).
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BEAM Co., 809 S. Orlando Ave., Suite I , Winter Park , FL ,
32789 , USA 407-629-1282
Tel. 877-803-6579 (toll-free)
Fax 407-629-0460
e-mail: sales@beamco.com
http://www.beamco.com/
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