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References
Crystal scan
Crystal-Scan optical multimeter
Crystal-Scan optical multimeter, model CSX-300
CSX-300		 Crystal-Scan optical multimeter, model CSX-400
CSX-400		 Winner of the Photonics circle of excellence award
Winner of the Photonics Circle of Excellence Award
Crystal-Scan optical multimeter, model CSX-500
CSX-500		 US Patent number 6678042




Crystal scan functions
Crystal-Scan is an interactive modular system for laser beam and optics characterization easily reconfigurable for high-precision and fast measurements of several parameters of laser beams, focusing optics and other optical components that are substantial for most laser applications. The base models allow:
  • high precision determination of focus position
  •  measuring diameter of focused laser beams
  •  measuring peak power density of the beam
  •  characterization of quality of lenses and objectives
Crystal-Scan is the only commercially available device with the range of focal waist measurements from less than 1 mm and up to 100 mm diameter. It can be set up within minutes, and performs the measurement within seconds. Optional accessories extend the capabilities of the system to measuring:
  •  laser beam divergence
  •  quality factor
  •  diameter of unfocused laser beams (mircoscanning configuration), and
  •  power of unfocused laser beams (mircoscanning configuration).
Measurements of power and beam diameter in Microscanning configuration, are performed on-line, without introducing any appreciable distortion into the beam. The educational model CSX-300 (educational model) allows simplified insertion and removal of lenses without affecting the alignment of the overall system. In a single laboratory hour, students will be able to verify all main laws governing laser beam propagation, and the effect of aberrations.  A reliable and an affordable measuring tool for everyday needs of optics professionals and laser users…
crystal scan optical multimeter specifications
Device feature/Model CSX-400 CSX-500 CSX-300
Waist measurement range 2 µm - 200 µm 0.5 µm - 100 µm 3 µm - 150 µm
Unfocused beam width measurements range 100 µm - 5 mm 100 µm - 3 mm 100 µm - 5 mm
Laser power range 1 mW – 10 W 1 mW – 10 W 1 mW – 10 W
Damage threshold 1 kW/cm2 - 1 MW/cm2 1 kW/cm2 - 1 MW/cm2 1 kW/cm2 - 1 MW/cm2
Power density range 10 W/cm2 – 1 MW/cm2 10 W/cm2 – 1 MW/cm2 10 W/cm2 – 1 MW/cm2
Wavelength range 0.4 mm - 1.8 mm 0.4 mm - 1.8 µm 0.4 mm - 1.8 mm
Aperture of sensor head 12.5 mm or 25.4 mm 0.4” x 0.4" 12.5 mm or 25.4 mm
Measurement time 30 s 20 s 30 s
Absolute standard error < 4 % < 4 % < 4 %
Weight 546 g 412 g 574 g
Dimensions 3.25” x 8” x 1.5” 1.5” x 2” x 6” 3.25” x 9.5” x 1.5”
Power supply 110 V/220 V 110 V/220 V 110 V/220 V
Data acquisition and display Desktop or Notebook Desktop or Notebook Desktop or Notebook
Lead Time 6 weeks 6 weeks 3 weeks
Noninear Optical Element
  LC-VL1 LC-VL2 LC-IL
Wavelength range 0.4 µm – 0.7 µm 0.4 µm – 1.8 µm 0.9 µm – 1.3 µm
Power range 1 mW - 100 mW 100 mW - 10 W 1 mW - 100 mW
Maximum power density 1 kW/cm2 1 MW/cm2 1 kW/cm2
Clear aperture sizes available 12.5 mm, 25.4 mm, 10 mm x 10 mm
Photodetector*
  PDA-55 PDA-155 PDA-400
Wavelength range 0.4  mm – 1.1 mm 0.2 mm – 1.1 mm 0.7 mm – 1.8 mm
* Thorlab parts      
crystal scan optical multimeter
Z-scan measurements of the on-axis intensity on the scan coordinate for the optical nonlinearity Z-scan measurements of the on-axis intensity on the scan coordinate for the optical nonlinearity
Z-scan measurements of the on-axis intensity on the scan coordinate for the optical nonlinearity

References

  1. N.V. Tabiryan, “Liquid crystals measure light intensity”, Laser Focus World, April, 34, pp. 165-168 (1998).
  2. S.R. Nersisyan, N.V. Tabiryan, L.B. Glebov, L.N. Glebova, Nonlinear lens mapping of optical substrates, Proc. SPIE 6101, 370-376 (2006).
  3. S.R. Nersisyan, N.V. Tabiryan, C. Martin Stickley, Application of nonlinear optical techniques to characterization of glass and high power near IR cw laser beams, Proc. SPIE 5991, 599124-1 – 599124-11 (2005).
  4. N.V. Tabiryan, V. Jonnalagadda, M. Mora, S. R. Nersisyan, Laser beam and optics characterization with “z-scan” method, Proc. SPIE 4932, 7th International Workshop on Laser Beam and Optics Characterization, Boulder CO., pp. 656-666 (2003).
  5. N.V. Tabirian, H.L. Margaryan, “Nonlinear optical techniques for visualization and measurement of laser beams: M2 – measurements”, Edited by H. Laabs and H. Weber, 5th International Workshop on Laser Beam and Optics Characterization (LBOC), pp. 107-115 (2000).
  6. M. Bolshtyansky, N.V. Tabiryan, B.Ya. Zel’dovich. BRIEFING: beam reconstruction by iteration of an electromagnetic field with an induced nonlinearity gauge, Optics Letters 22, 22-24 (1997).
  7. N.V. Tabiryan, P. LiKamWa, B.Ya. Zel’dovich, T. Tschudi, T. Vogeler, Characterization of high power laser beams with the aid of nonlinear optical processes, SPIE 2870, 12-21 (1996).
  8. N.V. Tabiryan, T. Vogeler, T. Tschudi, B.Ya. Zel'dovich. All-optical, in-line, unperturbing and parallel measurement of laser beam intensity with transparent thin layers of liquid crystals”. Journal of Nonlinear Optical Physics, 4, 843-856 (1995).
  9. N.V. Tabiryan, T. Vogeler, T. Tschudi, B.Ya. Zel'dovich, Laser beam measurement with liquid crystals, Proc. SPIE 2375, 281-287 (1995).
BEAM Co.,
1300 Lee Road
,
Orlando
,
FL
,
32810
,
USA

Tel. (407) 734-5222
Fax (407) 969-0477
e-mail: sales@beamco.com, info@beamco.com.
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